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Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT

Institute of Electrical and Electronics Engineers Inc. — United States (Northern America)

Active in Scopusconference and proceedings
0.347SJR
41H-Index
1.34CiteScore
35Total Dokumen
173Sitasi 3 Tahun
19.1Ref/Dokumen
#15,694Rank Global
123Dokumen 3 Tahun

Identitas

ISSN Print
2576-1501
ISSN Electronic
2765933X
Cakupan Tahun
2021-2025
Scopus Source ID
21101123252

Bidang Subjek

  • Computer Science
  • Engineering

Kategori

  • Electrical and Electronic Engineering
  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality
  • Signal Processing

Tautan

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Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT — SJR 0.347 | ScopusLens Publiora