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IEEE International Test Conference (TC)

Institute of Electrical and Electronics Engineers Inc. — United States (Northern America)

Active in Scopusconference and proceedings
0.580SJR
84H-Index
1.29CiteScore
93Total Dokumen
294Sitasi 3 Tahun
17.1Ref/Dokumen
#10,225Rank Global
201Dokumen 3 Tahun

Identitas

ISSN Print
1089-3539
Cakupan Tahun
1989, 1992, 1995-2013, 2015-2025
Scopus Source ID
25589

Bidang Subjek

  • Engineering
  • Mathematics

Kategori

  • Applied Mathematics
  • Electrical and Electronic Engineering

Tautan

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IEEE International Test Conference (TC) — SJR 0.580 | ScopusLens Publiora