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IEEE International Conference on Microelectronic Test Structures

Institute of Electrical and Electronics Engineers Inc. — United States (Northern America)

Active in Scopusconference and proceedings
0.227SJR
24H-Index
0.50CiteScore
34Total Dokumen
48Sitasi 3 Tahun
10.3Ref/Dokumen
#20,381Rank Global
103Dokumen 3 Tahun

Identitas

ISSN Print
1071-9032
ISSN Electronic
2158-1029
Cakupan Tahun
1988, 1993-2020, 2022-2025
Scopus Source ID
79800

Bidang Subjek

  • Engineering

Kategori

  • Electrical and Electronic Engineering

Tautan

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IEEE International Conference on Microelectronic Test Structures — SJR 0.227 | ScopusLens Publiora