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Adversarial sketch-photo transformation for enhanced face recognition accuracy: a systematic analysis and evaluation

Shetty Kirimanjeshwara, Raghavendra MandaraNarasimha Prasad, Sarappadi
International Journal of Electrical and Computer Engineering (IJECE) (Sinta 1)Vol. 0 No. 01 Februari 2024
DOI10.11591/ijece.v14i1.pp315-325

Abstrak

This research provides a strategy for enhancing the precision of face sketch identification through adversarial sketch-photo transformation. The approach uses a generative adversarial network (GAN) to learn to convert sketches into photographs, which may subsequently be utilized to enhance the precision of face sketch identification. The suggested method is evaluated in comparison to state-of-the-art face sketch recognition and synthesis techniques, such as sketchy GAN, similarity-preserving GAN (SPGAN), and super-resolution GAN (SRGAN). Possible domains of use for the proposed adversarial sketch-photo transformation approach include law enforcement, where reliable face sketch recognition is essential for the identification of suspects. The suggested approach can be generalized to various contexts, such as the creation of creative photographs from drawings or the conversion of pictures between modalities. The suggested method outperforms state-of-the-art face sketch recognition and synthesis techniques, confirming the usefulness of adversarial learning in this context. Our method is highly efficient for photo-sketch synthesis, with a structural similarity index (SSIM) of 0.65 on The Chinese University of Hong Kong dataset and 0.70 on the custom-generated dataset.

Kata Kunci

Image ProcessingDeep LearningComputer ScienceAdversarial learningDeep learningFace sketch recognitionGenerative adversarial network hyperparameterStructural similarity index

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Adversarial sketch-photo transformation for enhanced face recognition accuracy: a systematic analysis and evaluation | International Journal of Electrical and Computer Engineering (IJECE) | Publiora